Hidden Costs of Buying Lab Equipment

Laboratory equipment is at the heart of modern research, driving discoveries and advancements in fields like medicine, biotechnology, and environmental science. But the costs of purchasing and maintaining this equipment can create significant hurdles. For startups, growing labs, and even well-established institutions, these expenses—such as repairs, upgrades, and depreciation—can slow progress and stretch budgets thin read more

What Are Focused Ion Beam Systems Used For?

Focused Ion Beam (FIB) systems are advanced tools primarily used in materials science, semiconductor manufacturing and nanotechnology. These systems utilize a finely focused beam of ions to modify, analyze and inspect materials with high precision. The capabilities of FIB systems make them indispensable in various fields, especially in microfabrication and failure analysis.

Key Applications of FIB Systems

FIB systems are widely used for imaging and analyzing the surface of materials at extremely high resolutions. By bombarding a sample with ions, FIB systems can create highly detailed images of structures at the nanoscale, allowing scientists and engineers to study fine features that would be difficult to detect with traditional microscopy.

Another important application is in sample preparation. FIB systems can mill or cut materials with nanometer precision, which is particularly useful in creating cross-sections of delicate samples for further analysis. This is crucial for industries like semiconductor manufacturing, where precision is essential to ensure the quality and functionality of microchips.

The Role

One prominent example of a FIB system is the FEI Scios 2 SEM-FIB Dual Beam. This advanced system combines the capabilities of both Scanning Electron Microscopy (SEM) and FIB technology, offering enhanced imaging and precise sample milling. This system is equipped with a high-resolution electron microscope and an ion beam for dual-purpose operations, making it ideal for applications such as 3D imaging and microstructural analysis.

With its versatility and accuracy, the FEI Scios 2 SEM-FIB Dual Beam is frequently used in material science, electronics and other high-tech industries. The ability to manipulate and analyze materials at the nanoscale has opened up new possibilities for research and development across various sectors.

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